Gen6™ C-SAM®
 
The Gen6 delivers the broadest range of capabilities available. Whether your needs are for nondestructive failure analysis, process development, R&D, High-Rel qualification for a military application, or low/medium-volume screening, the Gen6 is the one C-SAM system that can meet all of your demands. Gen6 is perfect for a variety of applications, such as; Microelectronics, MEMS, SSL LEDs, Power Modules, Solar, High-Tech materials, etc.

Features

  • PolyGate™ technology with Multi-Gate™ and Probing-Gate™ functions capable of single and multi-focus imaging
  • Up to 100 gates per channel with 2 Gsps sampling rate
  • Windows® 7 Ultimate for multi-language and 64-bit capabilities
  • Inertially Balanced Linear Motor Scanner with counterweight to minimize vibrations and ensure optimal scanning results
  • Tower-mounted scan reference platform and sample fixture
  • Open-access scanning area makes loading and unloading easy and is capable of scanning JEDEC trays or a 300mm wafer
  • Water recirculation and optional inline temperature control
  • SonoSimulator for simplified analysis of stacked die parts
  • Digital Image Analysis (DIA)™ uses advanced algorithms to quantify the acoustic data and allows you to set accurate, automatic, accept/reject criteria
  • Virtual Rescanning Mode (VRM)™ stores comprehensive data and enables you to perform a complete analysis of a sample, even when it is no longer available