The Gen6 delivers the broadest range of capabilities available. Whether your needs are for nondestructive failure analysis, process development, R&D, High-Rel qualification for a military application, or low/medium-volume screening, the Gen6 is the one C-SAM system that can meet all of your demands. Gen6 is perfect for a variety of applications, such as; Microelectronics, MEMS, SSL LEDs, Power Modules, Solar, High-Tech materials, etc.
Features
- PolyGate™ technology with Multi-Gate™ and Probing-Gate™ functions capable of single and multi-focus imaging
- Up to 100 gates per channel with 2 Gsps sampling rate
- Windows® 7 Ultimate for multi-language and 64-bit capabilities
- Inertially Balanced Linear Motor Scanner with counterweight to minimize vibrations and ensure optimal scanning results
- Tower-mounted scan reference platform and sample fixture
- Open-access scanning area makes loading and unloading easy and is capable of scanning JEDEC trays or a 300mm wafer
- Water recirculation and optional inline temperature control
- SonoSimulator for simplified analysis of stacked die parts
- Digital Image Analysis (DIA)™ uses advanced algorithms to quantify the acoustic data and allows you to set accurate, automatic, accept/reject criteria
- Virtual Rescanning Mode (VRM)™ stores comprehensive data and enables you to perform a complete analysis of a sample, even when it is no longer available
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